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Wafer Inspection Tool

Wafer Inspection Tool
Advanced Inspection Solutions for Silicon Wafer Quality Control

Truly provides automated inspection solutions for 200 mm and 300 mm Silicon Wafers, designed to detect and classify various defects with high precision and efficiency. 

Our inspection systems cover Pin Hole, Edge, Notch, and Surface Inspection, supporting reliable quality control throughout the silicon wafer manufacturing process.

Inspection Solutions
Pin Hole Inspection
Detects Pin Holes and Air Pockets in silicon wafers.

Edge Inspection
Detects defects such as Chips, Cracks, Scratches, Stains, and Particles on wafer edges and notch areas.

Edge & Surface Inspection
Provides integrated inspection of wafer Edge and Surface defects, supporting DSP, EPI, and CVD surfaces.

Key Features
● 200 mm & 300 mm Silicon Wafer
● Automated Defect Detection & Classification
● High-Resolution Vision Inspection
● Automated Wafer Handling
● High-Throughput Inspection

Truly provides reliable wafer inspection solutions for advanced silicon wafer manufacturing and quality control.